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Ion Formation from Organic Solids (IFOS III)

Mass Spectrometry of Involatile Material

  • Conference proceedings
  • © 1986

Overview

Editors:
  1. Alfred Benninghoven

    1. Physikalisches Institut, Universität Münster, Münster, Fed. Rep. of Germany

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Part of the book series: Springer Proceedings in Physics (SPPHY, volume 9)

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About this book

The 3rd International Conference on Ion Formation from Organic Solids (IFOS III) was held at the University of Munster, September 16-18, 1985. The conference was attended by 60 invited scientists from all over the world. Of the 43 papers which were presented, 40 are included in these proceedings. The aim of IFOS III was to promote the exchange of results and new ideas between scientists actively working in the field of mass spectrometry of involatile materials. Various aspects of the ion formation process - realization and optimization, theoretical understanding and analytical application -were treated, as well as instrumental developments. Some emphasis was placed on recent developments in time-of-flight and Fourier transform ion cyclotron resonance mass spectrometry, and its impact on the mass spectrometry of involatile materials. The most important goal of the conference was to combine facets of the understanding of the most complex ion formation processes with the many different aspects of its analytical application. The participants came from a wide variety of different fields, including pure and applied physics and chemistry, medicine, pharmacy, and space research. Finally, on behalf of all the conference participants, I would like to thank Dr. W. Sichtermann and :\1iss I. Bekemeier for the perfect preparation and technical organization of the conference. The next conference in this series, IFOS IV, is planned for the autumn of 1987, in Munster.

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Keywords

Table of contents (40 papers)

  1. Front Matter

    Pages I-X
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  2. 252Cf-Plasma Desorption

    1. Front Matter

      Pages 1-1
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    2. Particle Desorption from Non-Metallic Surfaces by High Energy Heavy Ions

      • W. Guthier
      Pages 17-21

  3. 252Cf-Plasma Desorption

    1. Use of Polymer Surfaces for Molecular Ion Adsorption and Desorption

      • R. D. Macfarlane, C. J. McNeal, R. G. Phelps
      Pages 2-5

    2. Electronic Sputtering of Biomolecules

      • B. Sundqvist, A. Hedin, P. Håkansson, G. Jonsson, M. Salehpour, G. Säve et al.
      Pages 6-10

    3. On the Charge-State Dependence of Secondary Ion Emission from Phenylalanine

      • O. Becker, W. Guthier, K. Wien, S. Della-Negra, Y. le Beyec, J. R. Cotter
      Pages 11-16

    4. 252Cf-PDMS: Multiplicity of Desorbed Ions and Correlation Effects

      • L. Schmidt, H. Jungclas
      Pages 22-26

  4. Secondary Ion Mass Spectrometry (SIMS)

    1. Front Matter

      Pages 27-27
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    2. Surface Organic Reactions Induced by Ion Bombardment

      • R. G. Cooks, B.-H. Hsu, W. B. Emary, W. K. Fife
      Pages 28-33

    3. Ion Bombardment MS: A Sensitive Probe of Chemical Reactions Occurring at the Surface of Organic Solids

      • B. T. Chait
      Pages 34-36

    4. Ion-Neutral Correlations Following Metastable Decay

      • K. G. Standing, W. Ens, R. Beavis, G. Bolbach, D. Main, B. Schueler et al.
      Pages 37-41

    5. Metastable Ion Studies with a 252Cf Time-of-Flight Mass Spectrometer

      • S. Della-Negra, Y. le Beyec
      Pages 42-45

    6. Increasing Secondary Ion Yields: Derivatization/SIMS

      • D. A. Kidwell, M. M. Ross, R. J. Colton
      Pages 46-50

    7. Aspects and Applications of Derivatization/SIMS

      • M. M. Ross, J. E. Campana, R. J. Colton, D. A. Kidwell
      Pages 51-55

    8. Influence of the Target Preparation on the SI-Emission of Organic Molecules

      • A. Eicke, A. Benninghoven
      Pages 56-61

    9. Secondary Ion Formation Processes in Amino Acid — Metal Adsorption Systems

      • D. Holtkamp, M. Kempken, P. Klüsener, A. Benninghoven
      Pages 62-66

    10. Analytical Applications of High-Performance TOF-SIMS

      • W. Lange, D. Greifendorf, D. van Leyen, E. Niehuis, A. Benninghoven
      Pages 67-73

    11. TOF-SIMS of Polymers in the High Mass Range

      • I. V. Bletsos, D. M. Hercules, D. van Leyen, E. Niehuis, A. Benninghoven
      Pages 74-78

    12. The Application of Time-of-Flight Secondary Ion Mass Spectrometry in the Characterization of Apolipoprotein Mutants

      • H.-U. Jabs, M. Walter, G. Assmann, A. Benninghoven
      Pages 79-83

  5. Liquid SIMS Including FAB

    1. Front Matter

      Pages 85-85
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Editors and Affiliations

  • Physikalisches Institut, Universität Münster, Münster, Fed. Rep. of Germany

    Alfred Benninghoven

Bibliographic Information

  • Book Title: Ion Formation from Organic Solids (IFOS III)

  • Book Subtitle: Mass Spectrometry of Involatile Material

  • Editors: Alfred Benninghoven

  • Series Title: Springer Proceedings in Physics

  • DOI: https://doi.org/10.1007/978-3-642-82718-1

  • Publisher: Springer Berlin, Heidelberg

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer-Verlag Berlin Heidelberg 1986

  • Softcover ISBN: 978-3-642-82720-4Published: 06 January 2012

  • eBook ISBN: 978-3-642-82718-1Published: 06 December 2012

  • Series ISSN: 0930-8989

  • Series E-ISSN: 1867-4941

  • Edition Number: 1

  • Number of Pages: X, 222

  • Topics: Physical Chemistry

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