Substrate bias effects during R-F sputtering of Y-Ba-Cu-O films A. J. DrehmanM. W. Dumais Rapid Communications 31 January 2011 Pages: 677 - 679
Preparation of small particle stabilized zirconia by aerosol pyrolysis A. R. Pebler Rapid Communications 31 January 2011 Pages: 680 - 682
Superconducting oxide YBa2Cu3O7−x prepared by the metal alkoxide method Shingo KatayamaMasahiro Sekine Articles 31 January 2011 Pages: 683 - 690
SEM and electrical studies of current induced superconducting-resistive transitions in Y1Ba2Cu3O7−x thin films A. FrenkelC. C. ChangB. Lalevic Articles 31 January 2011 Pages: 691 - 703
Defect structure of laser deposited Y-Ba-Cu-O thin films on single crystal MgO substrate R. RameshD. M. HwangT. Venkatesan Articles 31 January 2011 Pages: 704 - 716
Flexible stainless steel foil as a substrate for superconducting Y-Ba-Cu-O films S. WitanachchiS. PatelD. T. Shaw Articles 31 January 2011 Pages: 717 - 720
Yttrium enrichment and improved magnetic properties in partially melted Y-Ba-Cu-O materials Hamid HojajiAaron BarkattSidney Alterescu Articles 31 January 2011 Pages: 721 - 730
X-ray and electron diffraction study of single crystal Bi2Sr2CaCu2Ox X. B. KanJ. KulikZ. X. Zhao Articles 31 January 2011 Pages: 731 - 736
Characterization of (Bi, Pb)-Sr-Ca-Cu-O system by analytical electron microscopy Yasuhide InoueMasahiro HasegawaOsamu Nittono Articles 31 January 2011 Pages: 737 - 741
Structure and superconductivity of BaBiO3 doped with alkali ions D. TsengE. Ruckenstein Articles 31 January 2011 Pages: 742 - 745
Solid-state reaction of Ru powder in molten AlxBi1−x R. W. JohnsonC. M. Garland Articles 31 January 2011 Pages: 746 - 753
Brittle fracture and grain boundary chemistry of microalloyed NiAl E. P. GeorgeC. T. Liu Articles 31 January 2011 Pages: 754 - 762
The location of tantalum atoms in Ni3(Al, Ta) Hui LinDavid P. Pope Articles 31 January 2011 Pages: 763 - 768
Evolution of the microstructure of cobalt during diffusionless transformation cycles A. MunierJ. E. BidauxC. Esnouf Articles 31 January 2011 Pages: 769 - 775
Effect of residual stress and adhesion on the hardness of copper films deposited on silicon W. R. LaFontaineB. YostChe-Yu Li Articles 31 January 2011 Pages: 776 - 783
Transmission electron microscopy studies of bismuth films S. NahmL. Salamanca-RibaJ. Heremans Articles 31 January 2011 Pages: 784 - 788
Glass transformation phenomena in bulk and film amorphous selenium via DSC heating and cooling scans S. YannacopoulosS. O. Kasap Articles 31 January 2011 Pages: 789 - 794
Electrical performance and reaction kinetics of silicone gels C. P. Wong Articles 31 January 2011 Pages: 795 - 800
Electron microscopy of vapor phase deposited diamond B. E. WilliamsH. S. KongJ. T. Glass Articles 31 January 2011 Pages: 801 - 810
Optical properties of chemical-vapor-deposited diamond films Xiang Xin BiP. C. EklundC. P. Beetz Jr. Articles 31 January 2011 Pages: 811 - 817
Temperature and reactive etching effects on the microstructure of microwave plasma deposited diamond films Alan B. HarkerJeffery F. DeNatale Articles 31 January 2011 Pages: 818 - 823
Microstructure and conversion electron Mössbauer studies of M decrease in Fe3O4 films C. OrtizC. HwangX. Z. Zhou Articles 31 January 2011 Pages: 824 - 828
Classification and consequences of complex lead perovskite ferroelectrics with regard to B-site cation order C. A. RandallA. S. BhallaL. E. Cross Articles 31 January 2011 Pages: 829 - 834
MASS-NMR structural analysis of barium aluminofluorophosphate glasses with and without nitridation Joseph P. FletcherSubhash H. RisbudR. James Kirkpatrick Articles 31 January 2011 Pages: 835 - 840
Hole pattern formation in unfired ceramic sheets by pulsed Nd:YAG laser Rong-Fuh LouhRelva C. Buchanan Articles 31 January 2011 Pages: 841 - 846
Instrumentation of a conventional hardness tester for load-displacement measurement during indentation G. M. PharrR. F. Cook Articles 31 January 2011 Pages: 847 - 851
Fundamental issues in heteroepitaxy—A Department of Energy, Council on Materials Science Panel Report Ernst G. BauerBrian W. DodsonAndrew Zangwill Materials Reports 31 January 2011 Pages: 852 - 894
Erratum to: “MoS2−xOx solid solutions in thin films produced by rf-sputter-deposition” [J. Mater. Res. 5, 218 (1990)] Jeffrey R. Lince Erratum 31 January 2011 Pages: 895 - 895
