Volume 32, Issue 5 | Journal of Materials Research

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Volume 32, Issue 5

March 2017

Focus Issue: Aberration Corrected Transmission Electron Microscopy

10 articles in this issue

Introduction
Thomas Walther
Rafal E. Dunin-Borkowski
Eric A. Stach
Aberration Corrected Transmission Electron Microscopy 14 March 2017 Pages: 911 - 911
Recent studies of oxide-semiconductor heterostructures using aberration-corrected scanning transmission electron microscopy
David J. Smith
HsinWei Wu
Martha R. McCartney
Invited Article 01 August 2016 Pages: 912 - 920
Observation of compound semiconductors and heterovalent interfaces using aberration-corrected scanning transmission electron microscopy
David J. Smith
Jing Lu
Yong-Hang Zhang
Invited Feature Paper 30 August 2016 Pages: 921 - 927
New insights on ion track morphology in pyrochlores by aberration corrected scanning transmission electron microscopy
Ritesh Sachan
Yanwen Zhang
William J. Weber
Review 13 December 2016 Pages: 928 - 935
Comparison of convergent beam electron diffraction and annular bright field atomic imaging for GaN polarity determination
Alexana Roshko
Matt D. Brubaker
Igor Levin
Article 13 December 2016 Pages: 936 - 946
An effect of crystal tilt on the determination of ions displacements in perovskite oxides under BF/HAADF-STEM imaging mode
Y. Liu
Y. L. Zhu
X. L. Ma
Article 10 October 2016 Pages: 947 - 956
3D polarization texture of a symmetric 4-fold flux closure domain in strained ferroelectric PbTiO₃ films
Y. L. Tang
Y. L. Zhu
X. L. Ma
Article 12 July 2016 Pages: 957 - 967
Beam-induced atomic migration at Ag-containing nanofacets at an asymmetric Cu grain boundary
Nicolas J. Peter
Christian H. Liebscher
Gerhard Dehm
Article 14 November 2016 Pages: 968 - 982
Study of phase separation in an InGaN alloy by electron energy loss spectroscopy in an aberration corrected monochromated scanning transmission electron microscope
Thomas Walther
Xiaoyi Wang
Toshihiro Aoki
Article 08 December 2016 Pages: 983 - 995
Aberration-corrected self-interference of split higher order Laue zone line for measuring the z-dependent strain profile
Mana Norouzpour
Rodney Herring
Article 16 January 2017 Pages: 996 - 1008