Editors
- Series Editor
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- Cher Ming Tan
- Xuejun Fan
About the Editor
Cher Ming Tan received his Ph.D in Electrical Engineering from the University of Toronto in 1992. He has 8 years of working experiences in reliability in electronic industry (both Singapore and Taiwan) before joining Nanyang Technological University (NTU) as faculty member in 1996 till 2014. He is now a Professor in Chang Gung University, Taiwan and Director of Centre of Reliability Science and Technology. He has published more than 270 International Journal and Conference papers, and holding 10 patents and 1 copyright for reliability software. He has given more than 50 invited talks in International Conferences. He has written 5 books and 4 book chapters in the field of reliability.Nagarajan Raghavan obtained his Ph.D. (Microelectronics, 2012) at the Division of Microelectronics, Nanyang Technological University (NTU), Singapore and S.M. (Advanced Materials for Micro & Nano Systems, 2008) and M.Eng (Materials Science and Engineering, 2008) from National University of Singapore (NUS) and Massachusetts Institute of Technology (MIT), Boston respectively. He is now an Assistant Professor at the Singapore University of Technology and Design (SUTD). He is the recipient of the IEEE EDS Early Career Award for 2016, Asia-Pacific recipient for the IEEE EDS PhD Student Fellowship in 2011 and the IEEE Reliability Society Graduate Scholarship Award winner in 2008. To date, he has authored / co-authored more than 120 international peer-reviewed publications and four invited book chapters as well. He also holds a US patent as a co-inventor for using CMOS platform to fabricate RRAM devices.